NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE (WOOLLAM-VIS)

NIR-UV spectroscopic ellipsometer J. A. Woollam V-VASE
CONTACT US

Guarantor: Alois Nebojsa
Technology / Methodology: Optical measurements
Instrument status: Operational Operational, 2.11.2022 15:51
Equipment placement: CEITEC Nano - C1.21
Research group: CF: CEITEC Nano


Description:

The VASE is most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range from 193 to 2000nm. Variable wavelength and angle of incidence allow flexible measurement capabilities, absolute transmissivity and light scattering can be also measured.


Publications:

  • KEPIČ, P.; LIŠKA, P.; IDESOVÁ, B.; CAHA, O.; LIGMAJER, F.; ŠIKOLA, T., 2024: Pulsed laser deposition of Sb2S3 films for phase-change tunable nanophotonics. NEW JOURNAL OF PHYSICS 26(1), p. 1 - 8, doi: 10.1088/1367-2630/ad1696; FULL TEXT
    (ICON-SPM, KRATOS-XPS, LYRA, ALD, WITEC-RAMAN, RIGAKU9, WOOLLAM-VIS)
  • Hong, N. H.; Friák, M.; Pazourek, P.; Pham, N. S.; Nhu, T. Q.; Kiaba, M.; Gazdová, K.; Pavlů, J., 2024: 2D nature of magnetic states at SnO2 surfaces: a combined experimental and theoretical study. RSC ADVANCES 14(19), p. 13583 - 13590, doi: 10.1039/D4RA00734D; FULL TEXT
    (RIGAKU3, VERSALAB, WOOLLAM-VIS, KRATOS-XPS)
  • Castellano, A.; Alhada-Lahbabi, K.; Arregi, JA.; Uhlir, V.; Perrin, B.; Gourdon, C.; Fournier, D.; Verstraete, MJ.; Thevenard, L., 2024: Magnetic phase dependency of the thermal conductivity of FeRh from thermoreflectance experiments and numerical simulations. PHYSICAL REVIEW MATERIALS 8(8), doi: 10.1103/PhysRevMaterials.8.084411; FULL TEXT
    (MAGNETRON, VERSALAB, RIGAKU9, WOOLLAM-VIS)
  • MATTERN, M.; PUDELL, J.; ARREGI URIBEETXEBARRIA, J.; ZLÁMAL, J.; KALOUSEK, R.; UHLÍŘ, V.; RÖSSLE, M.; BARGHEER, M., 2024: Accelerating the Laser-Induced Phase Transition in Nanostructured FeRh via Plasmonic Absorption. ADVANCED FUNCTIONAL MATERIALS 34(32), doi: 10.1002/adfm.202313014; FULL TEXT
    (MAGNETRON, VERSALAB, RIGAKU9, ICON-SPM, WOOLLAM-VIS)
  • Franta, D.; Vohánka, J.; Dvořák, J.; Franta, P.; Ohlídal, I.; Klapetek, P.; Březina, J.; Škoda, D., 2023: Optical Characterization of Gadolinium Fluoride Films Using Universal Dispersion Model. COATINGS 13(2), doi: 10.3390/coatings13020218; FULL TEXT
    (WOOLLAM-VIS, FTIR)

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