LiteScope 2.5 (LITESCOPE-MIRA-STAN)

Description:

A unique atomic force microscope, the LiteScopeTM, designed for easy integration into a scanning electron microscope, represents a next-generation tool for complex in-situ characterization of samples in the field of material science, semiconductors, or life-science. It is equipped with patented CPEMTM technology allowing simultaneous acquisition and in-time correlation of both SEM and AFM signals providing outstanding imaging results.

Publications:

• HÜLAGÜ, D.; TOBIAS, C.; DAO, R.; KOMAROV, P.; RURACK, K.; HODOROABA, V., 2024: Towards 3D determination of the surface roughness of core-shell microparticles as a routine quality control procedure by scanning electron microscopy. SCIENTIFIC REPORTS 14(1), p. 1 - 13, doi: 10.1038/s41598-024-68797-7; FULL TEXT
  (LITESCOPE-MIRA-STAN, MIRA-STAN)
• Foltýn, M., 2024: Plasmonics of non-noble metals. MASTER´S THESIS , p. 1 - 83; FULL TEXT
  (HELIOS, MAGNETRON, TITAN, RIGAKU3, LITESCOPE-MIRA-STAN)
• FOLTÝN, M.; PATOČKA, M.; ŘEPA, R.; ŠIKOLA, T.; HORÁK, M., 2024: Influence of Deposition Parameters on the Plasmonic Properties of Gold Nanoantennas Fabricated by Focused Ion Beam Lithography. ACS OMEGA 9(35), p. 37408 - 9, doi: 10.1021/acsomega.4c06598; FULL TEXT
  (TITAN, HELIOS, RIGAKU3, LITESCOPE-MIRA-STAN)