Focused Ion Beam/Scanning Electron Microscope FEI Helios NanoLab 660 (HELIOS)

CONTACT US

Guarantor: Ondřej Man, Ph.D.
Instrument status: Operational Operational, 19.3.2025 14:59
Equipment placement: CEITEC Nano - A1.10
Research group: CF: CEITEC Nano


Description:

FEG-type scanning electron microscope with High/Low vacuum regime with resolution at least 1,5 nm @ 15 kV (in high vacuum mode) and with chamber allowing XY stage travel at least 100x100 mm. Equipped with analytical attachments EDS + WDS + EBSD.


Publications:

  • FOLTÝN, M.; PATOČKA, M.; ŘEPA, R.; ŠIKOLA, T.; HORÁK, M., 2024: Influence of Deposition Parameters on the Plasmonic Properties of Gold Nanoantennas Fabricated by Focused Ion Beam Lithography. ACS OMEGA 9(35), p. 37408 - 9, doi: 10.1021/acsomega.4c06598; FULL TEXT
    (TITAN, HELIOS, RIGAKU3, LITESCOPE-MIRA-STAN)
  • ČALKOVSKÝ, V.; MACH, J.; BARTOŠÍK, M.; PIASTEK, J.; KOSTKA, M.; MIKERÁSEK, V.; SUPALOVÁ, L.; KONEČNÝ, M.; KVAPIL, M.; HORÁK, M.; ŠIKOLA, T., 2024: Preparation of GaN Nanocrystals with Single Ag Cores. CRYSTAL GROWTH AND DESIGN 24(19), p. 7904 - 6, doi: 10.1021/acs.cgd.4c00776; FULL TEXT
    (TITAN, HELIOS, TERS)
  • Zeman, P.; Haviar, S.; Houška, J.; Thakur, D.; Bondarev, A.; Červená, M.; Medlín, R.; Čerstvý, R., 2024: Self-formation of dual-phase nanocomposite Zr–Cu–N coatings based on nanocrystalline ZrN and glassy ZrCu. MATERIALS & DESIGN 245, doi: 10.1016/j.matdes.2024.113278; FULL TEXT
    (TITAN, HELIOS, NANOINDENTER)
  • Antunes Corrêa, C.; Volný, J.; Uhlířová, K.; Verhagen, T., 2024: Mapping Sliding Ferroelectricity in Bulk (PbS) 1.11 VS 2 Crystals. PHYSICA STATUS SOLIDI (RRL) – RAPID RESEARCH LETTERS 18(12), p. 1 - 8, doi: 10.1002/pssr.202400189; FULL TEXT
    (TITAN, HELIOS)
  • SEPÚLVEDA SEPÚLVEDA, L.; SOPHA, H.; NORIKAWA, Y.; HROMÁDKO, L.; RODRIGUEZ PEREIRA, J.; MAN, O.; NOHIRA, T.; YASUDA, K.; MACÁK, J., 2024: Can electrodeposited Ti replace rolled Ti as substrate for the growth of anodic TiO2 nanotube layers?. ELECTROCHIMICA ACTA 479, doi: 10.1016/j.electacta.2024.143877; FULL TEXT
    (HELIOS)

Show more publications...