Share Share Share

FIB-SIMS quantification using TOF-SIMS with Ar and Xe plasma sources

SURFACE AND INTERFACE ANALYSIS

Stevie, FA; Sedlacek, L; Babor, P; Jiruse, J; Principe, E; Klosova, K, 2014: FIB-SIMS quantification using TOF-SIMS with Ar and Xe plasma sources. SURFACE AND INTERFACE ANALYSIS 46, p. 285 - 287, doi: 10.1002/sia.5483

Research Groups:

• Fabrication and Characterisation of Nanostructures

CEITEC authors:

• Petr Bábor, Ph.D.