Development of Methods for Analysis and Measuring
– Petr Klapetek
Center of electron and photonic optics
(TN02000020),
Technologická agentura ČR, Technology Agency of the Czech Republic, 2023 - 2028
Development and applications of ultra-precise optical measurement techniques
(TN02000020/002),
Technologická agentura ČR, Technology Agency of the Czech Republic, 2023 - 2028
Research and development of new technologies for the production of a bipolar transistor with insulated gate (TIGBT)
(TH01010419),
EPSILON, 2015 - 2017
Nanometrology using methods of scanning probe microscopy
(KAN311610701),
Academy of Sciences of the Czech Republic - Nanotechnologies for Society, 2007 - 2011
Analysis of the optical properties of solar cells
(FT-TA3/142),
Ministry of Industry and Trade - TANDEM, 2006 - 2009