CURRENT RESEARCH INFRASTRUCTURE
The methods of scanning probe microscopy (AFM, STM, MFM, EFM, SThM, NSOM) for commercial and custom devices.
Numerical simulation of distributed computing systems and supercomputers consisting of graphics cards.
Nanpositioning and Nanomeasuring machine (NMM1, Sios) for SPM, optical and tactile mesurements with single nanometer resolution up to centimeter range.
