Cross section/broad beam ion polisher Leica EM TIC3X (TIC3X)

Description:

Device for ion polishing samples for scanning electron microscopy beam of light ions, enabling the creation of precise cross sections fragile, heterogeneous, porous and temperature sensitive materials for their studies by scanning electron microscopy and analytical methods EBSD, EDS and WDS. Furthermore, the instrument allows ion polishing large surfaces at oblique incidence of the ion beam for studying the foregoing materials mentioned methods.

Publications:

• SUCHÝ, J.; KLAKURKOVÁ, L.; MAN, O.; REMEŠOVÁ, M.; HORYNOVÁ, M.; PALOUŠEK, D.; KOUTNÝ, D.; KRIŠTOFOVÁ, P.; VOJTĚCH, D.; ČELKO, L., 2021: Corrosion behaviour of WE43 magnesium alloy printed using selective laser melting in simulation body fluid solution. JOURNAL OF MANUFACTURING PROCESSES 69, p. 556 - 11, doi: 10.1016/j.jmapro.2021.08.006; FULL TEXT
  (VERIOS, TIC3X, RIGAKU3)
• ŠŤASTNÝ, P.; VACEK, P.; TRUNEC, M., 2020: Characterization of microstructure and phase distribution of sintered multiphasic calcium phosphate bioceramics. CERAMICS INTERNATIONAL 46(4), p. 5500 - 5, doi: 10.1016/j.ceramint.2019.10.300; FULL TEXT
  (TIC3X, VERIOS, TITAN, HELIOS, RIGAKU3)