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Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method

SURFACE AND INTERFACE ANALYSIS

Polcak, J; Cechal, J; Babor, P; Urbanek, M; Prusa, S; Sikola, T, 2010: Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method. SURFACE AND INTERFACE ANALYSIS 42(41826), p. 649 - 652, doi: 10.1002/sia.3361

Research Groups:

• Fabrication and Characterisation of Nanostructures

CEITEC authors:

• Michal Urbánek, Ph.D.
• Stanislav Průša, Ph.D.
• Prof. Tomáš Šikola