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Search results for: bábor

Publikace 36

SURFACE SCIENCE

A study of a LEIS azimuthal scan behavior: Classical dynamics simulation

Matlocha, T; Prusa, S; Kolibal, M; Babor, P; Primetzhofer, D; Markin, SN; Bauer, P; Sikola, T

doi: 10.1016/j.susc.2010.07.026

SURFACE SCIENCE

A study of Ga layers on Si(100)-(2 x 1) by SR-PES: Influence of adsorbed water

Cechal, J; Mach, J; Voborny, S; Kostelnik, P; Babor, P; Spousta, J; Sikola, T

ACTA PHYSICA POLONICA A

Analysis of thin films by time-of-flight low energy ion scattering

Prusa, S; Kolibal, M; Babor, P; Mach, J; Sikola, T

SURFACE AND INTERFACE ANALYSIS

Angle-resolved XPS depth profiling of modeled structures: testing and improvement of the method

Polcak, J; Cechal, J; Babor, P; Urbanek, M; Prusa, S; Sikola, T

doi: 10.1002/sia.3361

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS

Depth resolution enhancement by combined DSIMS and TOF-LEIS profiling

Babor, P; Duda, R; Prusa, S; Matlocha, T; Kolibal, M; Cechal, J; Urbanek, M; Sikola, T

doi: 10.1016/j.nimb.2010.11.087

APPLIED SURFACE SCIENCE

Formation of copper islands on a native SiO2 surface at elevated temperatures

Cechal, J; Polcak, J; Kolibal, M; Babor, P; Sikola, T

doi: 10.1016/j.apsusc.2009.12.168

APPLIED SURFACE SCIENCE

Sn-CeO(2) thin films prepared by rf magnetron sputtering: XPS and SIMS study

Masek, K; Vaclavu, M; Babor, P; Matolin, V

SOLID STATE PHENOMENA

Polycrystalline Silicon Layers with Enhanced Thermal Stability

Lysacek, D; Sik, J; Babor, P

SURFACE AND INTERFACE ANALYSIS

FIB-SIMS quantification using TOF-SIMS with Ar and Xe plasma sources

Stevie, FA; Sedlacek, L; Babor, P; Jiruse, J; Principe, E; Klosova, K

doi: 10.1002/sia.5483

NANOTECHNOLOGY

Focused ion beam fabrication of spintronic nanostructures: an optimization of the milling process

Urbanek, M; Uhlir, V; Babor, P; Kolibalova, E; Hrncir, T; Spousta, J; Sikola, T

doi: 10.1088/0957-4484/21/14/145304

LANGMUIR

Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS

PRŮŠA, S.; PROCHÁZKA, P.; BÁBOR, P.; ŠIKOLA, T.; TER VEEN, R.; FARTMANN, M.; GREHL, T.; BRÜNER, P.; ROTH, D.; BAUER, P.; BRONGERSMA, H.

doi: 10.1021/acs.langmuir.5b01935

NANO RESEARCH

High-resolution characterization of hexagonal boron nitride coatings exposed to aqueous and air oxidative environments

JIANG, L.; XIAO, N.; WANG, B.; GRUSTAN-GUTIERREZ, E.; JING, X.; BÁBOR, P.; KOLÍBAL, M.; LU, G.; WU, T.; WANG, H.; HUI, F.; SHI, Y.; SONG, B.; XIE, X.; LANZA, M.

doi: 10.1007/s12274-016-1393-2

Journal of Alloys and Compounds

Thickness of sublimation grown SiC layers measured by scanning Raman spectroscopy

Kunc, J.; Rejhon, M.; Dědič, V.; Bábor, P.

doi: 10.1016/j.jallcom.2019.02.305

Komparativní analýza vrstevnatých struktur metodou SIMS

BÁBOR, P.

CARBON

Electron emission from H-terminated diamond enhanced by polypyrrole grafting

UKRAINTSEV, E.; KROMKA, A.; JANSSEN, W.; HAENEN, K.; TAKEUCHI, D.; BÁBOR, P.; REZEK, B.

doi: 10.1016/j.carbon.2020.12.043

Metody povrchové a tenkovrstvové analýzy prvkového složení (XPS, AES, SIMS), dirfrakce elektronů.

BÁBOR, P.; MAŠEK, K.

SURFACE AND COATINGS TECHNOLOGY

Investigation of the effect of argon ion beam on CdZnTe single crystals surface structural properties

ŠIK, O.; BÁBOR, P.; ŠKARVADA, P.; POTOČEK, M.; TRČKA, T.; GRMELA, L.; BELAS, E.

doi: 10.1016/j.surfcoat.2016.05.006

RSC ADVANCES

Real-time observation of self-limiting SiO2/Si decomposition catalysed by gold silicide droplets

BÁBOR, P.; DUDA, R.; POLČÁK, J.; PRŮŠA, S.; POTOČEK, M.; VARGA, P.; ČECHAL, J.; ŠIKOLA, T.

doi: 10.1039/c5ra19472e

THIN SOLID FILMS

Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques

Ber, B; Babor, P; Brunkov, PN; Chapon, P; Drozdov, MN; Duda, R; Kazantsev, D; Polkovnikov, VN; Yunin, P; Tolstogouzov, A

doi: 10.1016/j.tsf.2013.05.154

VACUUM

Low Energy Ion Scattering as a depth profiling tool for thin layers - Case of bromine Methanol etched CdTe

ŠIK, O.; BÁBOR, P.; POLČÁK, J.; BELAS, E.; MORAVEC, P.; GRMELA, L.; STANĚK, J.

doi: 10.1016/j.vacuum.2018.03.014

MATERIALS CHARACTERIZATION

3D localization of spinel (MgAl2O4) and sodium contamination in alumina by TOF-SIMS

HOLEŇÁK, R.; SPUSTA, T.; POTOČEK, M.; SALAMON, D.; ŠIKOLA, T.; BÁBOR, P.

doi: 10.1016/j.matchar.2018.12.019

The Effect Of Antibacterial Selenium Nanoparticles On The Properties Of Polymer-Phosphate Bone Fillers

GRÉZLOVÁ, V.; MICHLOVSKÁ, L.; ŠMERKOVÁ, K.; KOPEL, P.; ADAM, V.; KOČIOVÁ, S.; BÁBOR, P.; DIVIŠ, P.; POLÁČEK, P.; VOJTOVÁ, L.

Polycrystalline Silicon Layers with Enhanced Thermal Stability

BÁBOR, P.; LYSÁČEK, D.; ŠIK, J.

Příprava vzorků pro testování rozlišení

BÁBOR, P.; POTOČEK, M.; ŠIKOLA, T.

Držák vzorků pro chlazení (20K) a žíhání vzorků (1000 K) v UHV podmínkách.

AXMAN, T.; BÁBOR, P.

Thixotropic polymer-phosphate bone filler modified with antibacterial selenium nanoparticles

GRÉZLOVÁ, V.; VOJTOVÁ, L.; MICHLOVSKÁ, L.; ŠMERKOVÁ, K.; KOPEL, P.; ADAM, V.; KOČIOVÁ, S.; BÁBOR, P.; DIVIŠ, P.

ACTA MATERIALIA

Interphase boundary layer-dominated strain mechanisms in Cu+ implanted Zr-Nb nanoscale multilayers

DAGHBOUJ, N.; CALLISTI, M.; SEN, H. S.; KARLIK, M.; ČECH, J.; VRONKA, M.; HAVRÁNEK, V.; ČAPEK, J.; MINÁRIK, P.; BÁBOR, P.; POLCAR, T.

doi: 10.1016/j.actamat.2020.10.072

Sputter depth profiling of Mo/B4C/Si and Mo/Si multilayer nanostructures: A round-robin characterization by different techniques

BER, B.; BÁBOR, P.; BRUNKOV, P.; CHAPON, P.; DROZDOV, M.; DUDA, R.; KAZANTSEV, D.; POLKOVNIKOV, V.; YUNIN, P.; TOLSTOGOUZOV, A.

JOURNAL OF CRYSTAL GROWTH

Luminescence redshift of thick InGaN/GaN heterostructures induced by the migration of surface adsorbed atoms

VANĚK, T., HÁJEK, F., DOMINEC, F., HUBÁČEK, T., KULDOVÁ, K., PANGRÁC, J., KOŠUTOVÁ, T., KEJZLAR, P., BÁBOR, P., LACHOWSKI, A., HOSPODKOVÁ, A.

doi: 10.1016/j.jcrysgro.2021.126151

NUCLEAR MATERIALS AND ENERGY

Radiation damage evolution in pure W and W-Cr-Hf alloy caused by 5 MeV Au ions in a broad range of dpa

MACKOVÁ, A.; FERNANDES, S.; MATĚJÍČEK, J.; VILÉMOVÁ, M.; HOLÝ, V.; LIEDKE, M.O.; MARTAN, J.; VRONKA, M.; POTOČEK, M.; BÁBOR, P.; BUTTERLING, M.; ATTALLAH, A.G.; HIRSCHMANN, E.; WAGNER, A.; HAVRANEK,…

doi: 10.1016/j.nme.2021.101085

ACS APPLIED MATERIALS & INTERFACES

Interface-Driven Strain in Heavy Ion-Irradiated Zr/Nb Nanoscale Metallic Multilayers: Validation of Distortion Modeling via Local Strain Mapping

Sen, HS.; Daghbouj, N.; Callisti, M.; Vronka, M.; Karlik, M.; Duchon, J.; Cech, J.; Lorincik, J.; Havranek, V.; Babor, P.; Polcar, T.

doi: 10.1021/acsami.1c22995

ADVANCED MATERIALS INTERFACES

Electron Tractor Beam: Deterministic Manipulation of Liquid Droplets on Solid Surfaces

UKROPCOVÁ, I.; DAO, R.; ŠTUBIAN, M.; KOLÍBAL, M.; ŠIKOLA, T.; WILLINGER, M.; WANG, Z.; ZLÁMAL, J.; BÁBOR, P.

doi: 10.1002/admi.202201963

NATURE MATERIALS

Conversion of chirality to twisting via sequential one-dimensional and two-dimensional growth of graphene spirals

Wang, ZJ.; Kong, X.; Huang, YA.; Li, J.; Bao, LH.; Cao, KC.; Hu, YX.; Cai, J.; Wang, LF.; Chen, H.; Wu, YS.; Zhang, YW.; Pang, F.; Cheng, ZH.; Babor, P.; Kolibal, M.; Liu, ZK.; Chen, YL.; Zhang, Q.;…

doi: 10.1038/s41563-023-01632-y

NANO TODAY

Layer-by-layer growth of bilayer graphene single-crystals enabled by proximity catalytic activity

Zhang, ZH.; Zhou, LW.; Chen, ZX.; Jaros, A.; Kolíbal, M.; Bábor, P.; Zhang, QZ.; Yan, CL.; Qiao, RX.; Zhang, Q.; Zhang, T.; Wei, W.; Cui, Y.; Qiao, JS.; Liu, LW.; Bao, LH; Yang, HT.; Cheng, ZH.;…

doi: 10.1016/j.nantod.2024.102482

ELECTROCHIMICA ACTA

Electrochemistry of different boranes, carbaboranes and their exo-skeletal hydroxy derivatives at the graphite carbon electrode in aqueous phosphate buffers

Fojt, L; Fojta, M; Holub, J; Gruner, B; Vespalec, R

doi: 10.1016/j.electacta.2016.04.106

JOURNAL OF ELECTROANALYTICAL CHEMISTRY

Electrochemistry of parent and exo-skeletally substituted icosahedral monocarba and dicarbaboranes and their derivatives at the graphite carbon electrode in aqueous phosphate buffers

Fojt, L; Fojta, M; Gruner, B; Vespalec, R

doi: 10.1016/j.jelechem.2014.07.023

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