LiteScope 1.0 (LITESCOPE-LYRA)
Instrument status:
Operational, 4.6.2024 16:45
Equipment placement:
Vysoké učení technické v Brně, CEITEC
Research group:
CF: CEITEC Nano
Description:
A unique atomic force microscope, the LiteScopeTM, designed for easy integration into a scanning electron microscope, represents a next-generation tool for complex in-situ characterization of samples in the field of material science, semiconductors, or life science. It is equipped with patented CPEMTM technology allowing simultaneous acquisition and in-time correlation of both SEM and AFM signals providing outstanding imaging results.
Publications:
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SALAMON, D.; BUKVIŠOVÁ, K.; JAN, V.; POTOČEK, M.; ČECHAL, J., 2023: Superflux of an organic adlayer towards its local reactive immobilization. COMMUNICATIONS CHEMISTRY 6(1), doi: 10.1038/s42004-023-01020-2; FULL TEXT
(KRATOS-XPS, SIMS, LYRA, LITESCOPE-LYRA) -
UKROPCOVÁ, I.; DAO, R.; ŠTUBIAN, M.; KOLÍBAL, M.; ŠIKOLA, T.; WILLINGER, M.; WANG, Z.; ZLÁMAL, J.; BÁBOR, P., 2023: Electron Tractor Beam: Deterministic Manipulation of Liquid Droplets on Solid Surfaces. ADVANCED MATERIALS INTERFACES 10(2), doi: 10.1002/admi.202201963; FULL TEXT
(NANOSAM, LITESCOPE-LYRA, MIRA-STAN) -
Gazdík, R., 2022: Real-time study of reaction waves. BACHELOR´S THESIS , p. 1 - 36; FULL TEXT
(LITESCOPE-LYRA) -
Novotný, O., 2021: Correlated probe and electron microscopy for the study of modern magnetic nanomaterials. MASTER´S THESIS , p. 1 - 88; FULL TEXT
(LITESCOPE-LYRA, LYRA) -
SOBOLA, D.; RAMAZANOV, S.; KONEČNÝ, M.; ORUDZHEV, F.; KASPAR, P.; PAPEŽ, N.; KNÁPEK, A.; POTOČEK, M., 2020: Complementary SEM-AFM of Swelling Bi-Fe-O Film on HOPG Substrate. MATERIALS 13(10), p. 1 - 15, doi: 10.3390/ma13102402; FULL TEXT
(SIMS, WITEC-RAMAN, LITESCOPE-LYRA, KRATOS-XPS, LYRA)