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Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS

LANGMUIR

PRŮŠA, S.; PROCHÁZKA, P.; BÁBOR, P.; ŠIKOLA, T.; TER VEEN, R.; FARTMANN, M.; GREHL, T.; BRÜNER, P.; ROTH, D.; BAUER, P.; BRONGERSMA, H., 2015: Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS. LANGMUIR 31(35), p. 9628 - 8, doi: 10.1021/acs.langmuir.5b01935; FULL TEXT
(UHV-LEIS)

Equipment:

• Ultra High Vacuum Preparation and Analytical System - Low Energy Ion Spectroscopy ION-TOF Qtac 100

Research Groups:

• Fabrication and Characterisation of Nanostructures
• Molecular Nanostructures at Surfaces

CEITEC authors:

• Stanislav Průša, Ph.D.
• Petr Bábor, Ph.D.
• Prof. Tomáš Šikola
• Pavel Procházka, Ph.D.